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Nanometrics to Present at the 15th Annual Needham Growth Conference(January 02, 2013)
MILPITAS, Calif., Jan. 2, 2013 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology and inspection systems, today announced that Dr. Timothy Stultz, president and chief executive officer, is scheduled to present at the 15th Annual Needham Growth Conference.
The conference will take place at the New York Palace Hotel, NY from January 15-17, 2013. Nanometrics is scheduled to present on Thursday, January 17 at 11:20 AM ET.
The presentation material, along with a live audio webcast and archived recording of the presentation, will be made available on Nanometrics' website at www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics' automated and integrated systems address numerous process control applications, including critical dimension and film thickness measurement, device topography, defect inspection, overlay registration, and analysis of various other film properties such as optical, electrical and material characteristics. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.
The Nanometrics Incorporated logo is available at http://www.globenewswire.com/newsroom/prs/?pkgid=14865
CONTACT: Investor Relations Contact:
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